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Solar Metrology is a global leader in high-performance X-Ray Fluorescence (XRF) analysis systems. Solar Metrology XRF tools are specifically engineered for the demanding thin film measurement requirements of the Solar Electric and Power Storage industries.

  Our core focus is delivering production-ready XRF analysis tools for composition and thickness measurement of thin film depositions used in the manufacture of photovoltaics, power storage devices and other energy-related products.

  We offer a comprehensive line of XRF thin film analysis systems, ideally suited for research and process development, in-process monitoring and post-process quality control.

  At Solar Metrology, our commitment is to you...

                          ...the Next Generation Energy Provider.

 

CORPORATE HEADQUARTERS
5 Tower Drive, P.O. Box 209
Saugerties, New York, USA 12477
Tel: 845.247.4701
Fax: 845.247.4707

www.solarmetrology.com

info@solarmetrology.com

 


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Introducing SYSTEM SMX - The world's most powerful XRF thickness and composition measurement tool for thin film Solar PV process control
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SOLAR METROLOGY SYSTEM SMX
A powerful suite of XRF tools for solar PV thin film composition and thickness analysis
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